UID:
almafu_9959328554002883
Format:
1 online resource (xviii, 309 pages) :
,
illustrations
ISBN:
9783527633869
,
3527633863
,
9783527633852
,
3527633855
Note:
Radial Speckle Interferometry and Applications / Armando Albertazzi Gonçalves, Matías R Viotti -- Depth-Resolved Displacement Field Measurement / Jonathan M Huntley, Pablo D Ruiz -- Single-Image Interferogram Demodulation / Manuel Servin, Julio Estrada, Antonio Quiroga -- Phase Evaluation in Temporal Speckle Pattern Interferometry Using Time-Frequency Methods / Alejandro Federico, Guillermo H Kaufmann -- Optical Vortex Metrology / Wei Wang, Steen G Hanson, Mitsuo Takeda -- Speckle Coding for Optical and Digital Data Security Applications / Arvind Kumar, Madan Singh, Kehar Singh.
Additional Edition:
Print version: Advances in Speckle Metrology and Related Techniques. Vch Pub 2011 ISBN 9783527409570
Language:
English
Keywords:
Electronic books.
;
Electronic books.
;
Electronic books.
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527633852
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527633852
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527633852
