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Nondestructive evaluation of semiconductor materials and devices : [lectures presented at the NATO Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices, held at the Villa Tusculano, Italy, September 19 - 29, 1978] (1979)

Zemel, Jay N. ; Advanced Study Institute on Nondestructive Evaluation of Semiconductor Materials and Devices 1978 Frascati

New York [u.a.] :Plenum Press,

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Details

UID:

almafu_BV002279267

Format: XI, 782 S. : , Ill., graph. Darst.

ISBN: 0-306-40293-9

Series Statement: NATO advanced study institutes series : Series B, Physics 46

Language: English

Subjects: Physics

RVK:

UP 2800

RVK:

UP 3100

Keywords: Halbleiterwerkstoff ; Werkstoffprüfung ; Halbleiter ; Charakterisierung ; Halbleiter ; Zuverlässigkeit ; Akustische Messtechnik ; Konferenz ; Optische Messtechnik ; Zerstörungsfreie Werkstoffprüfung ; Rückstreuung ; Röntgenographie ; Halbleiterbauelement ; Konferenzschrift ; Konferenzschrift

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