UID:
almahu_9948196953202882
Format:
1 online resource (xii, 323 pages) :
,
illustrations
Edition:
Electronic reproduction. [Place of publication not identified] : HathiTrust Digital Library, 2010.
ISBN:
9783527615117
,
3527615113
,
9783527615100
,
3527615105
Content:
Scanning tunneling microscopy (STM) and atomic force microscopy (AFM) are powerful tools for surface examination. In the past, many STM and AFM studies led to erroneous conclusions due to lack of proper theoretical considerations and of an understanding of how image patterns are affected by measurement conditions. For this book, two world experts, one on theoretical analysis and the other on experimental characterization, have joined forces to bring together essential components of STM and AFM studies: The practical aspects of STM, the image simulation by surface electron density plot calculat.
Note:
Introduction -- Physical phenomena relevant to STM and AFM -- Scanning probe microscopes -- Practical aspects of STM and AFM measurements -- Simulations of STM and AFM images -- STM and AFM images of layered inorganic compounds -- STM images associated with point defects of layered inorganic compounds -- Surface relaxation in STM and AFM images -- Organic conducting salts -- Organic adsorbates at liquid/solid interfaces -- Self-assembled structures -- Polymers.
,
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Additional Edition:
Print version: Magonov, Sergei N. Surface analysis with STM and AFM. Weinheim ; New York : VCH, ©1996 ISBN 3527293132
Additional Edition:
ISBN 9783527293131
Language:
English
Keywords:
Electronic books.
DOI:
10.1002/9783527615117
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527615117
