UID:
almahu_9949199571002882
Format:
XIX, 748 p.
,
online resource.
Edition:
1st ed. 2001.
ISBN:
9783662045169
Content:
This book teaches graduate students the concepts of trans- mission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materi- als. It emphasizes themes common to both techniques, such as scattering from atoms and the formation and analysis of dif- fraction patterns. It also describes unique aspects of each technique, especially imaging and spectroscopy in the TEM. The textbook thoroughly develops both introductory and ad- vanced-level material, using over 400 accompanying illustra- tions. Problems are provided at the end of each chapter to reinforce key concepts. Simple citatioins of rules are avoi- ded as much as possible, and both practical and theoretical issues are explained in detail. The book can be used as both an introductory and advanced-level graduate text since sec- tions/chapters are sorted according to difficulty and grou- ped for use in quarter and semester courses on TEM and XRD.
Note:
1. Diffraction and the X-Ray Powder Diffractometer -- 2. The TEM and its Optics -- 3. Scattering -- 4. Inelastic Electron Scattering and Spectroscopy -- 5. Diffraction from Crystals -- 6. Electron Diffraction and Crystallography -- 7. Diffraction Contrast in TEM Images -- 8. Diffraction Lineshapes -- 9. Patterson Functions and Diffuse Scattering -- 10. High-Resolution TEM Imaging -- 11. Dynamical Theory -- Further Reading -- References and Figures -- A. Appendix -- A.1 Indexed Powder Diffraction Patterns -- A.3 Mass Attenuation Coefficients for Characteristic K?? X-Rays -- A.3 Atomic Form Factors for X-Rays -- A.4 X-Ray Dispersion Corrections for Anomalous Scattering -- A.5 Atomic Form Factors for 200 keV Electrons and Procedure for Conversion to Other Voltages -- A.6 Indexed Single Crystal Diffraction Patterns: fcc, bcc, dc, hcp -- A.7 Stereographic Projections -- A.8 Examples of Fourier Transforms -- A.10 Numerical Approximation for the Voigt Function -- A.11 Debye-Waller Factor from Wave Amplitude -- A.12 Review of Dislocations -- A.13 TEM Laboratory Exercises -- A.13.1 Preliminary - JEOL 2000FX Daily Operation -- A.13.2 Preliminary - Philips 400T Daily Operation -- A.13.6 Laboratory 4 - Contrast Analysis of Defects -- A.14 Fundamental and Derived Constants.
In:
Springer Nature eBook
Additional Edition:
Printed edition: ISBN 9783662045183
Additional Edition:
Printed edition: ISBN 9783662045176
Additional Edition:
Printed edition: ISBN 9783540678410
Language:
English
DOI:
10.1007/978-3-662-04516-9
URL:
https://doi.org/10.1007/978-3-662-04516-9
