UID:
almahu_9949112307202882
Umfang:
1 online resource (various pagings) :
,
illustrations (some color).
ISBN:
9780750325288
,
9780750325271
Serie:
IOP series in emerging technologies in optics and photonics
Inhalt:
Advances in Optical Surface Texture Metrology covers the latest advances in the development of optical surface texture measuring instruments. Rather than concentrate on the basic principles of the optical measurement methods, this book takes a deeper dive into the operation of the instruments and the new application areas where they can be applied, with an emphasis on advanced manufacturing. Latest advances discussed will include the drive towards faster instruments for in-process applications, the ability to measure highly complex surfaces (in e.g. additive manufacturing) and advances in the use of machine learning to enhance data analysis. Part of IOP Series in Emerging Technologies in Optics and Photonics.
Anmerkung:
"Version: 20201201"--Title page verso.
,
1. Terms and definitions / Richard Leach -- 2. Coherence scanning interferometry / Rong Su -- 3. Focus variation / Claudia Repitsch, Kerstin Zangl, Franz Helmli and Reinhard Danzl -- 4. Imaging confocal microscopy / Roger Artigas -- 5. Non-scanning techniques / Xiaobing Feng, Zhengchun Du and Jianguo Yang -- 6. Scattering approaches / Mingyu Liu -- 7. In-process surface topography measurements / Wahyudin P. Syam.
,
Also available in print.
,
Mode of access: World Wide Web.
,
System requirements: Adobe Acrobat Reader, EPUB reader, or Kindle reader.
Weitere Ausg.:
Print version: ISBN 9780750325264
Weitere Ausg.:
ISBN 9780750325295
Sprache:
Englisch
DOI:
10.1088/978-0-7503-2528-8
URL:
https://iopscience.iop.org/book/978-0-7503-2528-8
