UID:
almafu_9960112987602883
Format:
1 online resource (464 p.)
Edition:
Reprint 2021
ISBN:
9783112501344
Series Statement:
Physica status solidi / A. ; Volume 81, Number 2
Note:
Frontmatter --
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Classification Scheme --
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Contents --
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Original Papers --
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Structure --
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The Use of a Gas-Flow Proportional Counter for the Energetical Analysis of Photoelectrons under X-Ray Diffraction Conditions --
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Electron-Microscopic Study of Microdefects in Silicon Single Crystals Grown at High Speed --
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Tiber Morphology Resulting from Solid State Coalescence of Spherical Precipitates --
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Influence of Annealing Treatments on the Density of Amorphous Fe40Ni40P14B6 and Fe5Co70Si15B10 Alloys --
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Microstructural Properties of the ß-NiAl Phase in the Ternary Ni-Based Ni-Al-Ta Superalloys --
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Film and Interface Analysis of InSb MOS Structures --
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Defects, atomistic aspects --
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The Role of Nonelastic Nuclear Processes in the Formation of Defect Clusters in Semiconductors Irradiated with High-Energy Protons --
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The Application of the Wulff Construction to Dislocation Problems --
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High-Temperature Internal Friction Peaks of Pure Aluminum Single-, Bi-, and Polycrystals Measured with an Inverted Flexure Pendulum --
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Magnetic Anomalies of Self-Diffusion and Co Heterodiffusion in a-Fe --
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Magnetism --
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Electrical and Magnetic Properties of the Fe18Cr(30-40)Ni Alloys at Low Temperatures --
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Barkhausen Jumps in a Dual-Phase Steel Treated in the Intercritical Temperature Bange --
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Effects of Magnetostriction on Vibrations of Bloch and Néel Walls --
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Localized electronic states and transitions --
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Thermoluminescence Emission and Decay Kinetics of NaCl:SnCI2 Single Crystals --
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Investigation of the Recombination Mechanism in GaAs0.11P0.89:N --
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Photoluminescence and Optical Properties of Lithium-Doped MgxZn1-xTe Alloys --
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Electric transport --
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Optical Phonon Assisted Hopping in (DPPE)(TCNQ)5(H2O) --
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An Equation for Dynamic Switching in Amorphous Thin Films --
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A Semi-Classical Model for Simulating Inversion Carrier Transport in Si MOS Devices --
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DC Conductivity and ESR of Hydrogenated Amorphous Carbon Films --
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A Method for the Measurement of Thermal Conductivity, Thermal Diffusivity, and Other Transport Coefficients of Thin Films --
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Device-related phenomena --
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Basics of Electron-Impact-Excited Luminescence Devices --
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Efficiency and Saturation in AC Thin Film EL Structures --
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Comparison of MOCYD-Grown with Conventional H-VI Materials Parameters for EL Thin Films --
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Selected Analytical Tools Yield a Better Insight into Electroluminescent Thin Films --
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Electroluminescence of SiOx-LnF3 Thin Films --
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Concentration and Field Dependences of Electroluminescence Decay Kinetics in ZnS:Mn Thin Film Structures --
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Degradation Model of Red GaP LEDs --
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Transfer Effects in ODMR Spectra of ZnSe:Mn --
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Direct Current Electroluminescence in Rare-Earth-Doped Zinc Sulphide --
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Mechanism oi Excitation of Rare-Earth Complexes in Electroluminescence Devices --
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Optical Study of ZnS:Mn Thin Films with High Mn Concentrations --
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EPR Investigations of ZnS:Mn and ZnSe:Mn. Single Crystals, Powders, Thin-Film Structures --
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On the Polarization of Center Radiation in an Optically Thin Layer. The Resonator Effect on the Phototransition Probability --
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Annealing of Luminescent ZnSe:Mn Thin Films by a Scanning CW Laser Beam --
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On the Time Behaviour of Electron Impact Excitation in Thin Film Electroluminescent Devices --
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On the Mechanism of Electron-Impact-Excited Luminescence in AC Thin Film Devices: ZnSe:Mn --
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Minority Carrier Lifetime Measurements by Photoluminescence at Room Temperature in GaAs1-xPxN, Te (x = 0.70) --
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Erratum --
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Erratum zu: Calculation of Neutron-Induced Defect Clusters in Silicon and Comparison with TEM Investigations --
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Short Notes --
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High Voltage Electron Microscopic (HVEM) Observations of Dislocations in Monocrystalline Gypsum --
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4-Cyano-1,3,6-triazacycl[3.3.3]azine — A Homomolecular Organic Semiconductor --
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Glass-Crystal Transitions in Materials in the System As2S3-As2Te3 --
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High Concentration Fe-Cu and Fe-Ag Alloys Produced by Vapor Quenching --
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The Surface Roughness Effect in Texture Measurements by the Schulz X-Ray Reflection Method --
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Light Scattering by Defects in TGS --
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The Investigation of Hydrogen Diffusion in Palladium by the Chemichromic Effect --
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Anomalous Heat Conduction of Ion-Implanted Amorphous Layers in Silicon Crystals Using a Laser-Probe Technique --
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Quantitative EBIC Investigations on Bulk Stacking Faults in Silicon --
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Internal Friction in Ni-Zn Ferrites --
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On the Nature of the X-Centers in KC1, Studied by Positron Angular Correlation --
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The Influence of Minority Carrier Injection on Subthreshold Defects in Silicon --
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Temperature Dependence of the Magnetic Susceptibility of Teniolite --
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Thermopower and Resistivity in Correlation to B-Site Magnetic Ordering in Cu-Ni and Cu-Cd Ferrospinels --
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Magnetic Field Sign Effect on Resonance Absorption in Domain Walls of Orthoferrites --
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Deep Levels in Czochralski p-Si Due to Heat Treatment at 600 to 900 °C --
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Systems of Interacting Centers of Photoluminescence in RbMnF3 and KMnF3 --
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Lasting Relaxations and Residual Conductivity in InSe1-xSx Single Crystals --
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Anomalous Effects of Adsorption on the Electric Conductivity of Some Organic Semiconductor Powders under Pressure --
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Superconductivity and Atomic Ordering of Pd-Cu-H Solid Solutions --
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Radiation Defects in Single Crystals of Zinc Diphosphide --
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Electrical Properties of Annealed InSb Thin Films --
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Emission Patterns of Tb Doped ZnS Bulk Crystals --
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Pre-Frinted Titles --
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Pre-Frinted Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) --
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Classification Scheme —Continued --
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Backmatter
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In English.
Additional Edition:
ISBN 9783112501337
Language:
English
DOI:
10.1515/9783112501344
URL:
https://doi.org/10.1515/9783112501344
URL:
https://www.degruyter.com/isbn/9783112501344
URL:
https://doi.org/10.1515/9783112501344
URL:
https://www.degruyter.com/isbn/9783112501344