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Book

Ximen, Jiye

Orlando [u.a.] :Acad. Press,

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Details

UID:

almafu_BV002193814

Format: XIII, 433 S. : , Ill., graph. Darst.

ISBN: 0-12-014579-0

Series Statement: Advances in electronics and electron physics : Supplement 17

Note: Literaturangaben

Language: English

Subjects: Physics

RVK:

UH 5090

RVK:

UH 6300

Keywords: Ionenoptik ; Abbildungsfehler ; Elektronenoptik ; Abbildungsfehler

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