UID:
almahu_9948196439502882
Umfang:
1 online resource (xxii, 673 pages) :
,
illustrations
Ausgabe:
2nd ed.
ISBN:
0471457779
,
9780471457770
,
0471439959
,
9780471439950
,
0471457787
,
9780471457787
Inhalt:
The increase in the size and complexity of circuits on a chip with little or no increase in the number of Input/Output pins has made the need for testing ever more important. The test must detect failures in individual units, as well as failures caused by defective manufacturing processes. Random defects that go undetected may result in expensive recalls and also endanger the public, since digital logic devices have become pervasive in products that affect public safety, including applications such as transportation and human implants among others. This thoroughly revised edition of the author.
Anmerkung:
Introduction -- Simulation -- Fault Simulation -- Automatic Test Pattern Generation -- Sequential Logic Test -- Automatic Test Equipment -- Developing a Test Strategy -- Design-For-Testability -- Built-In Self-Test -- Memory Test -- I(DDQ) -- Behavioral Test and Verification.
Weitere Ausg.:
Print version: Miczo, Alexander. Digital logic testing and simulation. Hoboken, NJ : Wiley-Interscience, ©2003 ISBN 0471439959
Sprache:
Englisch
Schlagwort(e):
Electronic books.
;
Electronic books.
;
Electronic books.
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/0471457787
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/0471457787
URL:
https://onlinelibrary.wiley.com/doi/book/10.1002/0471457787
URL:
Volltext
(URL des Erstveröffentlichers)
