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Secondary Ion Mass Spectrometry SIMS II : Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27-31, 1979 (1979)

Benninghoven, A. [editor.] ; Evans, C.A. Jr. [editor.] ; Powell, R.A. [editor.] ; [et al.]

Berlin, Heidelberg :Springer Berlin Heidelberg :

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Details

UID:

almahu_9949198780002882

Format: XIV, 300 p. , online resource.

Edition: 1st ed. 1979.

ISBN: 9783642618710

Series Statement: Springer Series in Chemical Physics, 9

Note: I. Fundamentals Chairpersons: D.E. Harrison and C.A. Evans, Jr. -- II. Quantitation Chairpersons: D.B. Wittry and P. Williams -- III. Semiconductors Chairpersons: C.W. Magee and W. Werner -- IV. Static SIMS Chairperson: A. Benninghoven -- V. Metallurgy Chairpersons: J.D. Brown and A.P. von Rosenstiel -- VI. Instrumentation Chairpersons: D.S. Simons and F.G. Rüdenauer -- VII. Geology Chairpersons: J. Okano and C. Meyer -- VIII. Panel Discussion Chairperson: I.L. Kofsky -- IX. Biology Chairpersons: M.S. Burns and G.H. Morrison -- X. Combined Techniques Chairpersons: C. Johnson and W.H. Christie -- XI. Postdeadline Papers -- Index of Authors.

In: Springer Nature eBook

Additional Edition: Printed edition: ISBN 9783642618734

Additional Edition: Printed edition: ISBN 9783540098430

Additional Edition: Printed edition: ISBN 9783642618727

Language: English

DOI: 10.1007/978-3-642-61871-0

URL: https://doi.org/10.1007/978-3-642-61871-0