Book
Amsterdam 〈〈[u.a.]〉〉 : North Holland
Format:
IX, 275 S.
,
Ill., graph. Darst.
Series Statement:
Advances in CAD for VLSI 5
Language:
Undetermined
Subjects:
Computer Science
Keywords:
VLSI
;
Prüftechnik
;
VLSI
;
Test
;
VLSI
;
Prüftechnik
;
CAD
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