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    Online Resource
    Online Resource
    Waltham, MA : Academic Press is an imprint of Elsevier
    UID:
    b3kat_BV044391962
    Format: 1 online resource
    Edition: First edition
    ISBN: 9780128019405 , 0128019409 , 9780128019351
    Series Statement: Semiconductors and semimetals v. 91
    Content: This volume, number 91 in the Semiconductor and Semimetals series, focuses on defects in semiconductors. Defects in semiconductors help to explain several phenomena, from diffusion to getter, and to draw theories on materials' behavior in response to electrical or mechanical fields. The volume includes chapters focusing specifically on electron and proton irradiation of silicon, point defects in zinc oxide and gallium nitride, ion implantation defects and shallow junctions in silicon and germanium, and much more. It will help support students and scientists in their experimental and theoretical paths
    Note: Includes bibliographical references and index
    Language: English
    Keywords: Halbleiter ; Gitterbaufehler
    URL: Volltext  (URL des Erstveröffentlichers)
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