Format:
Online-Ressource (1 online resource (216 p.))
,
digital, PDF file(s).
Edition:
Online-Ausg.
ISBN:
9780511525261
Series Statement:
Cambridge Solid State Science Series
Content:
This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis
Note:
Title from publisher's bibliographic system (viewed on 05 Oct 2015)
,
Ch. 1. Introduction -- Ch. 2. XPS -- Ch. 3. Information from polymer XPS -- Ch. 4. Static SIMS (SSIMS) -- Ch. 5. Information from SSIMS -- Ch. 6. Polymer surface analysis case studies.
Additional Edition:
ISBN 9780521352222
Additional Edition:
ISBN 9780521017534
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 978-052-135-222-2
Additional Edition:
Erscheint auch als Druck-Ausgabe ISBN 9780521352222
Language:
English
DOI:
10.1017/CBO9780511525261
