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  • 1
    Online Resource
    Online Resource
    Reliability investigation of LED devices for public light applications / (2017)
    Kidlington, Oxford, England ; : ISTE Press :
    Details
    UID:
    almahu_9949232371802882
    Format: 1 online resource (224 pages).
    ISBN: 0-08-101092-3
    Series Statement: Durability, Robustness and Reliability of Photonic Devices Set
    Note: Front Cover -- Reliability Investigation of LED Devices for Public Light Applications -- Copyright -- Contents -- Introduction -- Chapter 1. Light-emitting Diodes: State-of-the-Art GaN Technologies -- 1.1. Current economic context -- 1.2. State-of-the-art GaN-based LEDs -- 1.3. Positioning, justification and objectives of the study -- 1.4. Conclusion -- Chapter 2. Tools and Analysis Methods of Encapsulated LEDs -- 2.1. Junction temperature measurement methodologies -- 2.2. Mechanisms and electrical models of an LED -- 2.3. Mechanisms and optical models of LED -- 2.4. Physicochemical characterizations of an LED -- 2.5. Conclusion -- Chapter 3. Failure Analysis Methodology of Blue LEDs -- 3.1. Mission and aging profile -- 3.2. Aging campaigns -- 3.3. Initial characterization of LEDs: electrical and optical aspects -- 3.4. Application of the methodology on low-power LEDs -- 3.5. Summary of results and conclusions -- Chapter 4. Integration of the Methodology Starting from Component Design -- 4.1. Mission profile for public lighting -- 4.2. Aging campaign and component description -- 4.3. Physical failure analysis -- 4.4. Summary of results and conclusions -- Conclusion -- Bibliography -- Index -- Back Cover.
    Additional Edition: ISBN 1-78548-149-5
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
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    Online Resource
    HU Berlin
    FU Berlin
    Charité
  • 2
    Online Resource
    Online Resource
    Reliability, robustness and failure mechanisms of led devices : methodology and evaluation (2016)
    London, England ; : ISTE Press :
    Details
    UID:
    almahu_9949697598302882
    Format: 1 online resource (174 p.)
    Note: Description based upon print version of record. , Front Cover ; Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation ; Copyright; Contents; Preface; Chapter 1. State-of-the-Art of Infrared Technology; 1.1. Introduction; 1.2. Compound materials III-V; 1.3. Light-emitting diodes; 1.4. Applications; 1.5. Conclusion; Chapter 2. Analysis and Models of an LED; 2.1. Introduction; 2.2. Physicochemical analysis; 2.3. Electro-optical analysis; 2.4. Initial characterizations of 935 nm LEDs; 2.5. Conclusion; Chapter 3. Physics of Failure Principles; 3.1. Introduction; 3.2. Aging tests; 3.3. Failure signatures , 3.4. Physics of failures3.5. Conclusion; Chapter 4. Methodologies of Reliability Analysis; 4.1. Introduction; 4.2. Method based on the physics of failures; 4.3. Digital methods; 4.4. A new approach; 4.5. Conclusion; Bibliography; Index; Back Cover
    Additional Edition: ISBN 1-78548-152-5
    Additional Edition: ISBN 0-08-101088-5
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
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    Online Resource
    HU Berlin
    FU Berlin
    Charité
  • 3
    Online Resource
    Online Resource
    Reliability, robustness and failure mechanisms of led devices : methodology and evaluation (2016)
    London, England ; : ISTE Press :
    Details
    UID:
    edoccha_9960074146702883
    Format: 1 online resource (174 p.)
    Note: Description based upon print version of record. , Front Cover ; Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation ; Copyright; Contents; Preface; Chapter 1. State-of-the-Art of Infrared Technology; 1.1. Introduction; 1.2. Compound materials III-V; 1.3. Light-emitting diodes; 1.4. Applications; 1.5. Conclusion; Chapter 2. Analysis and Models of an LED; 2.1. Introduction; 2.2. Physicochemical analysis; 2.3. Electro-optical analysis; 2.4. Initial characterizations of 935 nm LEDs; 2.5. Conclusion; Chapter 3. Physics of Failure Principles; 3.1. Introduction; 3.2. Aging tests; 3.3. Failure signatures , 3.4. Physics of failures3.5. Conclusion; Chapter 4. Methodologies of Reliability Analysis; 4.1. Introduction; 4.2. Method based on the physics of failures; 4.3. Digital methods; 4.4. A new approach; 4.5. Conclusion; Bibliography; Index; Back Cover
    Additional Edition: ISBN 1-78548-152-5
    Additional Edition: ISBN 0-08-101088-5
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
    BibTip Others were also interested in ...
    Online Resource
    Charité
  • 4
    Online Resource
    Online Resource
    Reliability, robustness and failure mechanisms of led devices : methodology and evaluation (2016)
    London, England ; : ISTE Press :
    Details
    UID:
    edocfu_9960074146702883
    Format: 1 online resource (174 p.)
    Note: Description based upon print version of record. , Front Cover ; Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation ; Copyright; Contents; Preface; Chapter 1. State-of-the-Art of Infrared Technology; 1.1. Introduction; 1.2. Compound materials III-V; 1.3. Light-emitting diodes; 1.4. Applications; 1.5. Conclusion; Chapter 2. Analysis and Models of an LED; 2.1. Introduction; 2.2. Physicochemical analysis; 2.3. Electro-optical analysis; 2.4. Initial characterizations of 935 nm LEDs; 2.5. Conclusion; Chapter 3. Physics of Failure Principles; 3.1. Introduction; 3.2. Aging tests; 3.3. Failure signatures , 3.4. Physics of failures3.5. Conclusion; Chapter 4. Methodologies of Reliability Analysis; 4.1. Introduction; 4.2. Method based on the physics of failures; 4.3. Digital methods; 4.4. A new approach; 4.5. Conclusion; Bibliography; Index; Back Cover
    Additional Edition: ISBN 1-78548-152-5
    Additional Edition: ISBN 0-08-101088-5
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
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    Online Resource
    FU Berlin
  • 5
    Book
    Book
    Reliability investigation of LED devices for public light applications (2017)
    London : ISTE Press | Kidlington, Oxford : Elsevier
    Details
    UID:
    b3kat_BV044316685
    Format: xii, 210 Seiten , Diagramme
    ISBN: 9781785481499
    Series Statement: Durability, robustness and reliability of photonic devices set
    Content: Front Cover -- Reliability Investigation of LED Devices for Public Light Applications -- Copyright -- Contents -- Introduction -- Chapter 1. Light-emitting Diodes: State-of-the-Art GaN Technologies -- 1.1. Current economic context -- 1.2. State-of-the-art GaN-based LEDs -- 1.3. Positioning, justification and objectives of the study -- 1.4. Conclusion -- Chapter 2. Tools and Analysis Methods of Encapsulated LEDs -- 2.1. Junction temperature measurement methodologies -- 2.2. Mechanisms and electrical models of an LED -- 2.3. Mechanisms and optical models of LED -- 2.4. Physicochemical characterizations of an LED -- 2.5. Conclusion -- Chapter 3. Failure Analysis Methodology of Blue LEDs -- 3.1. Mission and aging profile -- 3.2. Aging campaigns -- 3.3. Initial characterization of LEDs: electrical and optical aspects -- 3.4. Application of the methodology on low-power LEDs -- 3.5. Summary of results and conclusions -- Chapter 4. Integration of the Methodology Starting from Component Design -- 4.1. Mission profile for public lighting -- 4.2. Aging campaign and component description -- 4.3. Physical failure analysis -- 4.4. Summary of results and conclusions -- Conclusion -- Bibliography -- Index -- Back Cover
    Additional Edition: Erscheint auch als Online-Ausgabe ISBN 978-0-08-101092-1
    Language: English
    Subjects: Engineering
    RVK:
    ZN 5040
    RVK:
    ZN 8985
    Keywords: Lumineszenzdiode ; Galliumnitrid ; Lebensdauer ; Defekt ; Lumineszenzdiode ; Galliumnitrid ; Beleuchtungstechnik ; Öffentlicher Raum ; Lumineszenzdiode ; Galliumnitrid ; Straßenbeleuchtung ; Außenbeleuchtung
    URL: Volltext
    URL: Volltext  (kostenfrei)
    URL: Cover
    URL: Cover
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    Book
    Fulltext
    TU Berlin get availability status
  • 6
    Online Resource
    Online Resource
    Reliability investigation of LED devices for public light applications / (2017)
    Kidlington, Oxford, England ; : ISTE Press :
    Details
    UID:
    edoccha_9960161354702883
    Format: 1 online resource (224 pages).
    ISBN: 0-08-101092-3
    Series Statement: Durability, Robustness and Reliability of Photonic Devices Set
    Note: Front Cover -- Reliability Investigation of LED Devices for Public Light Applications -- Copyright -- Contents -- Introduction -- Chapter 1. Light-emitting Diodes: State-of-the-Art GaN Technologies -- 1.1. Current economic context -- 1.2. State-of-the-art GaN-based LEDs -- 1.3. Positioning, justification and objectives of the study -- 1.4. Conclusion -- Chapter 2. Tools and Analysis Methods of Encapsulated LEDs -- 2.1. Junction temperature measurement methodologies -- 2.2. Mechanisms and electrical models of an LED -- 2.3. Mechanisms and optical models of LED -- 2.4. Physicochemical characterizations of an LED -- 2.5. Conclusion -- Chapter 3. Failure Analysis Methodology of Blue LEDs -- 3.1. Mission and aging profile -- 3.2. Aging campaigns -- 3.3. Initial characterization of LEDs: electrical and optical aspects -- 3.4. Application of the methodology on low-power LEDs -- 3.5. Summary of results and conclusions -- Chapter 4. Integration of the Methodology Starting from Component Design -- 4.1. Mission profile for public lighting -- 4.2. Aging campaign and component description -- 4.3. Physical failure analysis -- 4.4. Summary of results and conclusions -- Conclusion -- Bibliography -- Index -- Back Cover.
    Additional Edition: ISBN 1-78548-149-5
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
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    Online Resource
    Charité
  • 7
    Online Resource
    Online Resource
    Reliability investigation of LED devices for public light applications / (2017)
    Kidlington, Oxford, England ; : ISTE Press :
    Details
    UID:
    edocfu_9960161354702883
    Format: 1 online resource (224 pages).
    ISBN: 0-08-101092-3
    Series Statement: Durability, Robustness and Reliability of Photonic Devices Set
    Note: Front Cover -- Reliability Investigation of LED Devices for Public Light Applications -- Copyright -- Contents -- Introduction -- Chapter 1. Light-emitting Diodes: State-of-the-Art GaN Technologies -- 1.1. Current economic context -- 1.2. State-of-the-art GaN-based LEDs -- 1.3. Positioning, justification and objectives of the study -- 1.4. Conclusion -- Chapter 2. Tools and Analysis Methods of Encapsulated LEDs -- 2.1. Junction temperature measurement methodologies -- 2.2. Mechanisms and electrical models of an LED -- 2.3. Mechanisms and optical models of LED -- 2.4. Physicochemical characterizations of an LED -- 2.5. Conclusion -- Chapter 3. Failure Analysis Methodology of Blue LEDs -- 3.1. Mission and aging profile -- 3.2. Aging campaigns -- 3.3. Initial characterization of LEDs: electrical and optical aspects -- 3.4. Application of the methodology on low-power LEDs -- 3.5. Summary of results and conclusions -- Chapter 4. Integration of the Methodology Starting from Component Design -- 4.1. Mission profile for public lighting -- 4.2. Aging campaign and component description -- 4.3. Physical failure analysis -- 4.4. Summary of results and conclusions -- Conclusion -- Bibliography -- Index -- Back Cover.
    Additional Edition: ISBN 1-78548-149-5
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
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    Online Resource
    FU Berlin
  • 8
    Online Resource
    Online Resource
    Méthodologies d'analyse de la Fiabilité de Dispositifs à LED. (2017)
    London :ISTE Editions Ltd.,
    Details
    UID:
    almahu_9949319351702882
    Format: 1 online resource (237 pages)
    Edition: 1st ed.
    ISBN: 9781784062798
    Note: Cover -- Table des matières -- Introduction -- Chapitre 1. Diodes électroluminescentes : état de l'art des technologies GaN -- Chapitre 2. Outils et méthodes d'analyse de LED encapsulées -- Chapitre 3. Méthodologie d'analyse de défaillance de LED bleues -- Chapitre 4. Intégration de la méthodologie dès la conception d'un composant -- Conclusion -- Bibliographie -- Index.
    Additional Edition: Print version: Baillot, Raphael Méthodologies d'analyse de la Fiabilité de Dispositifs à LED London : ISTE Editions Ltd.,c2017 ISBN 9781784052799
    Language: French
    Keywords: Electronic books.
    URL: Click to View
    Library Location Call Number Volume/Issue/Year Availability
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    Online Resource
    HU Berlin
  • 9
    Online Resource
    Online Resource
    Measurements, instruments and models of applied optoelectronics / (2020)
    Newcastle upon Tyne, United Kingdom :Cambridge Scholars Publisher,
    Details
    UID:
    almafu_9960963793802883
    Format: 1 online resource (391 pages) : , illustrations
    ISBN: 1-5275-5906-8
    Additional Edition: ISBN 1-5275-5543-7
    Language: English
    Library Location Call Number Volume/Issue/Year Availability
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    Online Resource
    FU Berlin
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