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  • 1
    Book
    Book
    London : ISTE Press | Kidlington, Oxford : Elsevier
    UID:
    b3kat_BV044316685
    Format: xii, 210 Seiten , Diagramme
    ISBN: 9781785481499
    Series Statement: Durability, robustness and reliability of photonic devices set
    Content: Front Cover -- Reliability Investigation of LED Devices for Public Light Applications -- Copyright -- Contents -- Introduction -- Chapter 1. Light-emitting Diodes: State-of-the-Art GaN Technologies -- 1.1. Current economic context -- 1.2. State-of-the-art GaN-based LEDs -- 1.3. Positioning, justification and objectives of the study -- 1.4. Conclusion -- Chapter 2. Tools and Analysis Methods of Encapsulated LEDs -- 2.1. Junction temperature measurement methodologies -- 2.2. Mechanisms and electrical models of an LED -- 2.3. Mechanisms and optical models of LED -- 2.4. Physicochemical characterizations of an LED -- 2.5. Conclusion -- Chapter 3. Failure Analysis Methodology of Blue LEDs -- 3.1. Mission and aging profile -- 3.2. Aging campaigns -- 3.3. Initial characterization of LEDs: electrical and optical aspects -- 3.4. Application of the methodology on low-power LEDs -- 3.5. Summary of results and conclusions -- Chapter 4. Integration of the Methodology Starting from Component Design -- 4.1. Mission profile for public lighting -- 4.2. Aging campaign and component description -- 4.3. Physical failure analysis -- 4.4. Summary of results and conclusions -- Conclusion -- Bibliography -- Index -- Back Cover
    Additional Edition: Erscheint auch als Online-Ausgabe ISBN 978-0-08-101092-1
    Language: English
    Subjects: Engineering
    RVK:
    RVK:
    Keywords: Lumineszenzdiode ; Galliumnitrid ; Lebensdauer ; Defekt ; Lumineszenzdiode ; Galliumnitrid ; Beleuchtungstechnik ; Öffentlicher Raum ; Lumineszenzdiode ; Galliumnitrid ; Straßenbeleuchtung ; Außenbeleuchtung
    URL: Volltext  (kostenfrei)
    URL: Cover
    URL: Cover
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