UID:
almahu_9949199330802882
Format:
XI, 258 p. 140 illus.
,
online resource.
Edition:
1st ed. 1999.
ISBN:
9783540496250
Series Statement:
Springer Tracts in Modern Physics, 149
Content:
This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.
Note:
Basic elements of the equipment -- Diffractometers and reflectometers -- Scans and resolution in angular and reciprocal space -- Basic principles -- Kinematical scattering theory -- Dynamical scattering theory -- Layer thicknesses of single layers and multilayers -- Lattice parameters and lattice strains in single expitaxial layers -- Volume defects in layers -- X-ray reflection by rough multilayers -- X-ray scattering by gratings and dots -- A. Wave vectors and amplitudes of the internal wavefields in a dynamically scattering crystal.
In:
Springer Nature eBook
Additional Edition:
Printed edition: ISBN 9783662147436
Additional Edition:
Printed edition: ISBN 9783662147429
Additional Edition:
Printed edition: ISBN 9783540620297
Language:
English
URL:
https://doi.org/10.1007/BFb0109385
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