Umfang:
xii, 210 Seiten
,
Diagramme
ISBN:
9781785481499
Serie:
Durability, robustness and reliability of photonic devices set
Inhalt:
Front Cover -- Reliability Investigation of LED Devices for Public Light Applications -- Copyright -- Contents -- Introduction -- Chapter 1. Light-emitting Diodes: State-of-the-Art GaN Technologies -- 1.1. Current economic context -- 1.2. State-of-the-art GaN-based LEDs -- 1.3. Positioning, justification and objectives of the study -- 1.4. Conclusion -- Chapter 2. Tools and Analysis Methods of Encapsulated LEDs -- 2.1. Junction temperature measurement methodologies -- 2.2. Mechanisms and electrical models of an LED -- 2.3. Mechanisms and optical models of LED -- 2.4. Physicochemical characterizations of an LED -- 2.5. Conclusion -- Chapter 3. Failure Analysis Methodology of Blue LEDs -- 3.1. Mission and aging profile -- 3.2. Aging campaigns -- 3.3. Initial characterization of LEDs: electrical and optical aspects -- 3.4. Application of the methodology on low-power LEDs -- 3.5. Summary of results and conclusions -- Chapter 4. Integration of the Methodology Starting from Component Design -- 4.1. Mission profile for public lighting -- 4.2. Aging campaign and component description -- 4.3. Physical failure analysis -- 4.4. Summary of results and conclusions -- Conclusion -- Bibliography -- Index -- Back Cover
Weitere Ausg.:
Erscheint auch als Online-Ausgabe ISBN 978-0-08-101092-1
Sprache:
Englisch
Fachgebiete:
Technik
Schlagwort(e):
Lumineszenzdiode
;
Galliumnitrid
;
Lebensdauer
;
Defekt
;
Lumineszenzdiode
;
Galliumnitrid
;
Beleuchtungstechnik
;
Öffentlicher Raum
;
Lumineszenzdiode
;
Galliumnitrid
;
Straßenbeleuchtung
;
Außenbeleuchtung
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