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Microscopy of Semiconducting Materials : Proceedings of the 14th Conference, April 11 - 14, 2005, Oxford, UK (2005)

Cullis, Anthony G. [Sonstige] ; Hutchison, J. L. [Sonstige]

Berlin [u.a.] : Springer

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UID:

b3kat_BV036650697

Format: 1 Online-Ressource

Edition: Online_Ausgabe Berlin [u.a.] Springer 2005 Springer ebook collection / Chemistry and Materials Science 2005-2008 Sonstige Standardnummer des Gesamttitels: 041171-1

ISBN: 9783540319153

Series Statement: Springer Proceedings in Physics 107

Additional Edition: Reproduktion von Microscopy of Semiconducting Materials 2005

Additional Edition: Erscheint auch als Druckausgabe ISBN 978-3-540-31914-6

Language: English

Keywords: Halbleiter ; Mikroskopie ; Konferenzschrift

DOI: 10.1007/3-540-31915-8

URL: Volltext

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